Vibration Isolation Case Studies
DAEIL SYSTEMS engineers active vibration isolation systems for the world's most demanding nanoscale imaging and metrology environments.
Series
Equipment Type
Manufacturer
All Case Studies
Tier-1 Semiconductor Advanced Institute SAIT Nikon NSR-2205i12D DVIA-P7000 Inspection Report
Tier-1 Semiconductor Advanced Institute SAIT Cleanroom Building A: DVIA-P7000 (140416R6-2) inspection on Nikon NSR-2205i12D stepper with IDLE-state vibration measurement, VC summary, transmissibility, and sensor checks.
Tier-1 Semiconductor Hwaseong Bruker AFM NM-4 DVIA-P4000 (036174) Inspection Report — December 2023
SHOWA-format inspection and vibration measurement report (inspection December 14, 2023; written December 18, 2023) for VAAV-4000H serial 036174 (SAC-07) at Tier-1 Semiconductor Hwaseong NRD Line 8F with Bruker AFM NM-4. Publishes VC summary table (Floor vs Active), displacement and accelerometer graphs, axis transmissibility and VC curves, regulator and unit photographs from the source document.
Tier-1 Semiconductor Hwaseong Bruker LA-02 DVIA-P4000 (039887B) Inspection Report — December 2023
Inspection and vibration measurement report (inspection December 14, 2023; written December 18, 2023) for DVIA-P4000 serial 039887B (SAC-07) at Tier-1 Semiconductor Hwaseong NRD Line 3F with Bruker LA-02. Publishes Floor vs Active VC summary table, displacement and accelerometer graphs, and axis transmissibility and VC curves from the source document.

Thermo Fisher Scientific Scios 2 DualBeam DVIA-M1000 Installation Report (CESI, Beijing, 220321R6)
CESI Beijing — Thermo Fisher Scios 2 DualBeam on DVIA-M1000 (220321R6): site tables, set-up photograph, and M1000 internal-program Z / X / Y performance captures.

Tianjin University Thermo Fisher ESEM Quattro110 DVIA-M1000 (230908R3-1) Installation Report — 2023.12.13
DVIA-M1000 serial 230908R3-1 — Tianjin University, Thermo Fisher Scientific ESEM Quattro110. Handout covers set-up on 2023.12.13 with internal-program performance plots for Z, X, and Y axes; equipment/site photo after the title block (cover logo omitted from publication).
Tier-1 Semiconductor Advanced Institute EVG 6200 Aligner DVIA-P2200 Inspection Report
DVIA-P2200 (140416R6-6) inspection and vibration measurement at Tier-1 Semiconductor Advanced Institute SAIT Cleanroom Building A, Suwon, with EVG 6200 aligner (IDLE). Published figures: installation site, sensor checks, axis transmissibility and VC curves (including 21.12.15 comparison), and grating-contact issue photo.