Bruker Korea ZEISS Solaris GeminiSEM 560 DVIA-ULF1000 (250717R1) Installation Report
Contents
Written by
Engineer: Chaewon Lee
Tuning Date: 25.10.13
Report Written Date: 25.10.14
Overview
This report outlines the installation details of DVIA-ULF1000 modular active vibration isolation platforms for ZEISS GeminiSEM 560 FE-SEM systems at Bruker Korea Demo lab.
DAEIL installed the DVIA-ULF1000 platform on a solid ground floor.
DAEIL performed site-specific tuning and vibration measurements along with six axes to assess and verify system performance.
All measured vibration data have been converted into VC (Vibration Criteria) curves. These curves are included in the report as a reference standard for current site assessment and future performance verification of the installed FE-SEM systems.
Tuning Date
13TH Oct, 2025
Installation Site
Bruker Korea Demo Lab
Equipment
Manufacturer: ZEISS
Equipment: FE-SEM
Model: Solaris GeminiSEM 560
Measurement Device
8.1) Data Physics DAQ
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
8.2) Accelerometer
PCB Accelerometer
Model: 393B05
Measurement Setup
Bandwidth: 200 Hz
Lines: 3200
Averaging: FFT Spectrum Averaging
Engineering Units: m/s
Window: Hanning
Averaging mode: Exponential, 40
Vibration Specification
Conclusion
After the installation of the ULF, floor vibration was reduced to within the vibration specification in all axes.
Measurement Summary
| Measurement Point | Status | Axis | Floor | DVIA-ULF1000 | Floor | DVIA-ULF1000 |
|---|---|---|---|---|---|---|
| 5F, Bruker Korea Demo실 1. Floor 2. DVIA-ULF1000 | Equipment Installed / Turned off | Vertical | VC-C @ 5 Hz | VC-G @ 5 Hz | ✗ FAIL | ✓ PASS |
| Left to Right | VC-D @ 12.5 Hz | VC-G @ 12.5 Hz | ✓ PASS | ✓ PASS | ||
| Front to Back | VC-C @ 1 Hz | VC-E @ 1 Hz | ✗ FAIL | ✓ PASS |
Data and Image
Vertical VC Curves
Vertical Autospectrum
Vertical Transmissibility
Left to Right VC Curves
Left to Right Autospectrum
Left to Right Transmissibility
Front to Back VC Curves
Front to Back Autospectrum
Front to Back Transmissibility
Installation Photo
Reference
*Notes:*
1. VC-A/B is measured in one-third octave bands over 8-80 Hz, VC-C through VC-G from 1-80 Hz.
2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.


