Bruker Korea ZEISS Gemini SEM 560 DVIA-ULF1000 Installation Report
Contents
Prepared by
Engineer: Chaewon Lee
Measurement date: October 13, 2025
Report written date: October 14, 2025
Overview
Tuning and vibration measurements were performed on the DVIA-ULF1000 installed at Garden Five Tool Hall 5F, Bruker Korea Demo Lab.
Measurements were conducted with the equipment installed and Turned off.
Data are presented as VC curves; reference information on vibration levels is provided.
Vibration Isolation System Information
Model: DVIA-ULF1000
Serial Number: 250717R1
Engineer
Chaewon Lee, Field Engineer — DAEIL SYSTEMS
Measurement Date
October 13, 2025
Installation Site
Garden Five Tool Hall 5F, Bruker Korea Demo Lab
End User
Bruker Korea
Equipment
Manufacturer: ZEISS
Equipment: FE-SEM
Model: GeminiSEM 560
Equipment specification
Equipment Status
Equipment installed and Turned off
Measurement Device
Data Physics DAQ
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
Accelerometer
PCB Accelerometer
Model: 393B05
Measurement Setup
F Span: 200 Hz
Lines: 3200
Engineering Units: m/s
Window: Hanning
Averaging: FFT Spectrum Averaging
Averaging mode: Exponential, 40
Conclusion
The vibration specification is satisfied on all axes.
Measurement Summary
| Measurement Point | Status | Axis | Measurement Data | Result | ||
|---|---|---|---|---|---|---|
| Floor | DVIA-ULF1000 | Floor | DVIA-ULF1000 | |||
| Garden Five Tool Hall 5F, Bruker Korea Demo Lab 1. Floor 2.DVIA-ULF1000 | Equipment installed / Turned off | Vertical | VC-C @ 5 Hz | VC-G @ 5 Hz | ✗ FAIL | ✓ PASS |
| Left to Right | VC-D @ 12.5 Hz | VC-G @ 12.5 Hz | ✓ PASS | ✓ PASS | ||
| Front to Back | VC-C @ 1 Hz | VC-E @ 1 Hz | ✗ FAIL | ✓ PASS | ||
Data and Image
Vertical VC Curves
Vertical Autospectrum
Vertical Transmissibility
Left to Right VC Curves
Left to Right Autospectrum
Left to Right Transmissibility
Front to Back VC Curves
Front to Back Autospectrum
Front to Back Transmissibility
Installation Photo
Reference
Generic Vibration Criteria
Notes:
1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.
2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.
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