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Installation Report
DVIA-ULF Series
11-04-2025

Tier-1 Semiconductor 2F Clean Booth DVIA-ULF700 (250708R1-1) Installation Report

DVIA-ULF Series
Installation Report
Tier-1 Semiconductor
DVIA-ULF700
250708R1-1

Overview

Tuning and vibration measurements were performed for the DVIA-ULF700 installed in the Tier-1 Semiconductor fab 2F clean booth.

Tuning and vibration measurements were performed with the equipment installed and in Turned on/IDLE.

A rotary pump connected to the equipment was operating above the vibration isolation platform, which may affect tuning and vibration measurement.

Measured data are presented as VC curves and reference materials on vibration levels are provided.

Vibration isolation platform

Model: DVIA-ULF700

Serial Number: 250708R1-1

Engineer

Chaewon Lee — Field Engineer, DAEIL SYSTEMS Co., Ltd.

Measurement Date

November 4, 2025

Installation Site

Tier-1 Semiconductor fab, 2F clean booth

End User

Tier-1 Semiconductor

Equipment

Manufacturer: Tier-1 Semiconductor

Equipment: N/A

Model: Self-made

Equipment Specifications

N/A

Equipment Status

Equipment installed and Turned on/IDLE

Measuring Instruments

10.1) Data Physics DAQ — Hardware: QUATTRO, Serial Number: 22436 — Software: SignalCalc ACE

10.2) Accelerometer — PCB Accelerometer — Model: 393B05

Measurement Setup

F Span: 200 Hz · Lines: 3200 · Engineering Units: m/s · Window: Hanning · Averaging: FFT Spectrum Averaging · Averaging mode: Exponential, 40

Conclusion

Except at specific frequencies affected by the rotary pump, vibration levels from VC-F through VC-G are measured.

Measurement Data

Measurement SiteStatusAxisFloorDVIA-ULF700
Tier-1 Semiconductor fab 2F clean booth
1. Floor vibration
2. DVIA-ULF700
Turned on/IDLEVerticalResidential Area
@ 50 Hz
VC-F
@ 50 Hz
Left to RightVC-C
@ 50 Hz
VC-G
@ 50 Hz
Front to BackVC-B
@ 50 Hz
VC-G
@ 50 Hz

Data and Images

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date11-04-2025
Tags
DVIA-ULF Series
Installation Report
Tier-1 Semiconductor
DVIA-ULF700
250708R1-1