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Installation Report
DVIA-ULF Series
05-21-2026

Greater Bay Area Quantum Center ZEISS Sigma 360 DVIA-ULF700 Installation Report

DVIA-ULF Series
Installation Report
Greater Bay Area Quantum Center
ZEISS
Sigma 360
FE-SEM
DVIA-ULF700

Overview

The DVIA-ULF700 active vibration isolation platform is appropriately installed and functioning as intended.

Vibration Isolation System Information

Model: DVIA-ULF700

Serial Number: 251110R7

Engineer

Juhyeok Kim from DAEIL SYSTEMS

Tuning Date

May 21, 2026

End User

Greater Bay Area Quantum Center

Number of Tuning Trial

1st

Location

Shenzhen, China.

Equipment

Manufacturer: ZEISS

Equipment: FE-SEM

Model: Sigma 360

Vibration Specification

Equipment Condition

The equipment isturned on/IDLE

Tuning Request

1st

Measurement Summary

Measurement PointStatusAxisVibrationSpecificationFloorDVIA-ULF700FloorDVIA-ULF700
1.Floor
2.DVIA-ULF700
Equipment is Turned on/IDLEVerticalVC-G{red}VC-C
@31.5Hz{/red}
{blue}VC-G
@31.5Hz{/blue}
FAILPASS
Left to RightVC-E{red}VC-E
@12.5Hz{/red}
{blue}VC-G
@12.5Hz{/blue}
PASSPASS
Front to BackVC-D{red}VC-D
@12.5Hz{/red}
{blue}VC-G
@12.5Hz{/blue}
PASSPASS

Measurement Data Obtained via UI Program

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Equipment picture

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

*Notes:*

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date05-21-2026
Tags
DVIA-ULF Series
Installation Report
Greater Bay Area Quantum Center
ZEISS
Sigma 360
FE-SEM
DVIA-ULF700