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Installation Report
DVIA-ULF Series
01-07-2026

Goertek Inc. ZEISS Sigma 300 DVIA-U1000 (220919R6-1) Installation Report

DVIA-U Series
Installation Report
Goertek
ZEISS
Sigma 300
DVIA-U1000
220919R6-1

Overview

Re-tuning was performed due to Z-axis oscillation.

DVIA-U1000 stability was secured by reducing the gain values.

Vibration Isolation System Information

Model: DVIA-ML1000

Serial Number: 220919R6-1

Engineer

Chaewon Lee DAEIL SYSTEMS

Tuning Date

December 19, 2025

Report written date

26.01.07

End User

Goertek Inc.

Number of Tuning Trial

2nd

Location

N/A

Equipment

Manufacturer: ZEISS

Equipment: FE-SEM

Model: Sigma 300

Equipment Condition

The equipment is turned on/IDLE

Tuning Request

N/A

Measurement Data Obtained via UI Program

Vertical Transmissibility

Left to Right Transmissibility

Front to Back Transmissibility

Equipment picture

Photo Not Allowed

13. Reference

Criterion CurveDescriptionAmplitude µm/s (µin/s)Detail Size µm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

*Notes:*

1. VC-A/B is measured in one-third octave bands over 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date01-07-2026
Tags
DVIA-U Series
Installation Report
Goertek
ZEISS
Sigma 300
DVIA-U1000
220919R6-1