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Installation Report
DVIA-ULF Series
02-26-2024

Lattice Semiconductor Phils ZEISS SEM EVO18 DVIA-U1000 (200203R4) Inspection Report — Philippines — 2024.02

DVIA-U Series
Inspection Report
Lattice Semiconductor
Philippines
ZEISS
SEM
EVO18
DVIA-U1000
200203R4

Prepared for

Lattice Semiconductor

Prepared by

Engineer: Jongwon Park

Inspection date: 24.02.16

Report written date: 24.02.26

Overview

This report provides comprehensive information on the on-site inspection of the DVIA-U1000 measured through the UI program and the vibration measurement device. The data was measured after conducting the repair of the DVIA-U1000, which initially had an issue with the Active button. We placed the accelerometer on the top plate and the bottom plate of the active vibration isolation platform, conducting the vibration measurements in three directions (vertical, left-right, and front-back), with the measurement displayed as VC curve, transmissibility graph, and autospectrum graph.

System Information

Model: DVIA-U1000

Serial Number: 200203R4

Engineer

Jongwon Park from DAEIL SYSTEMS

Inspection Date

February 16, 2024

Location

Lattice Semiconductor 1F Clean room Alabang, Philippines

Equipment

ZEISS SEM EVO18

Number of Tuning Trial

1st Inspection

Equipment Condition

Equipment is installed / Turned off

Measurement Device

9.1) Data Physics

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Measurement Setting

Bandwidth: 1 – 80 Hz

Lines: 800

Window: Hanning

Averaging: FFT Spectrum Averaging

Engineering Units:

9.3) Accelerometer

PCB Accelerometer

Model: 393B05

Conclusion

Access to the UI program was unavailable during the diagnostic trial. We replaced a DSP board, a communication cable, and an LCD board.

DVIA-U1000 reduced floor vibration in all axes below ZEISS SEM's allowable vibration specification.

Although the floor vibration meets the ZEISS SEM's allowable vibration specification, according to the floor vibration measurements, there is a high chance of potential vibration disturbing the ZEISS SEM in 60 – 70 Hz frequency range. 60 – 70 Hz frequency vibration can be minimized by a passive vibration isolation system; however, a passive vibration isolation system could amplify the floor vibration in 1 – 10 Hz, exceeding the ZEISS SEM's allowable vibration specification.

Summary of Measurements

Measurement PointVC curvesVC curvesVC curvesVC curvesVC curvesVC curves
Measurement PointZ-axis (Vertical) 1-10 HzZ-axis (Vertical) 12.5-80 HzX-axis (Left to Right) 1-10 HzX-axis (Left to Right) 12.5-80 HzY-axis (Front to Back) 1-10 HzY-axis (Front to Back) 12.5-80 Hz
FloorD(Pass)C(Pass)E(Pass)E(Pass)F(Pass)F(Pass)
ActiveF(Pass)G(Pass)F(Pass)G(Pass)F(Pass)G(Pass)

ZEISS EVO18 Allowable Vibration Spec

ZEISS EVO18 Allowable Vibration Spec VC-Curve (rms Velocity, m/s Graph)

Data and Image

UI Program Transmissibility

Z-axis (Vertical) Transmissibility

The transmissibility indicates that -14.9 dB (82%) vibration reduction at 4 Hz and -21.35 dB (91%) vibration reduction at 10 Hz.

X-axis (Left to Right) Transmissibility

The transmissibility indicates that -16.46 dB (85%) vibration reduction at 4 Hz and -26.05 dB (85%) vibration reduction at 10 Hz.

Y-axis (Front to Back) Transmissibility

The transmissibility indicates that -18.94 dB (88%) vibration reduction at 4 Hz and -26.06 dB (95%) vibration reduction at 10 Hz.

12.2 Vibration Measurement

Z-axis (Vertical) VC Curve

The DVIA-U1000 reduced vibration from VC-D (4.79E-06) to VC-F (1.32E-06) at 1 Hz, and from VC-C (1.20E-05) to VC-G (3.20E-07) at 63 Hz.

Z-axis (Vertical) Autospectrum Graph

X-axis (Left to Right) VC Curve

The DVIA-U1000 reduced vibration from VC-E (1.88E-06) to VC-F (1.06E-06) at 1 Hz, and from VC-E (1.58E-06) to VC-G (3.39E-07) at 63 Hz.

X-axis (Left to Right) Autospectrum Graph

Y-axis (Front to Back) VC Curve

The DVIA-U1000 reduced vibration from VC-F (1.29E-06) to VC-F (9.69E-07) at 1.75 Hz, and from VC-E (1.58E-06) to VC-G (3.39E-07) at 63 Hz.

Y-axis (Front to Back) Autospectrum Graph

Data Physics QUATTRO Vibration Measurement Device Transmissibility Graph

Transmissibility = Output / Input

The transmissibility graph is not a smooth curve because there was not enough floor vibration(input).

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

*Notes:*

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date02-26-2024
Tags
DVIA-U Series
Inspection Report
Lattice Semiconductor
Philippines
ZEISS
SEM
EVO18
DVIA-U1000
200203R4