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Installation Report
DVIA-M Series
05-11-2026

YIMO QIYUE TECHNOLOGY In situ SEM 660F DVIA-M1000 (240411R7) Installation Report

DVIA-M Series
Installation Report
YIMO
QIYUE TECHNOLOGY
SEM
In situ SEM 660F
DVIA-M1000
240411R7

Contents

Overview

The DVIA-M1000 active vibration isolation platform is appropriately installed and functioning as intended.

Vibration Isolation System Information

Model: DVIA-M1000

Serial Number: 240411R7

Engineer

Chaewon Lee from DAEIL SYSTEMS

Tuning Date

August 30, 2024

Report written date

September 9, 2024

Number of Tuning Trial

1st

Location

N/A

End User

N/A

Equipment

Manufacturer: QIYUE TECHNOLOGY

Equipment: SEM

Model: In situ SEM 660F

Equipment Condition

The equipment is installed/Turned off

Tuning Request

N/A

Data and Image

Vertical Transmissibility

Left to Right Transmissibility

Front to Back Transmissibility

11. Equipment

Reference

Criterion CurveDescriptionAmplitude
μm/s (µin/s)		Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date05-11-2026
Tags
DVIA-M Series
Installation Report
YIMO
QIYUE TECHNOLOGY
SEM
In situ SEM 660F
DVIA-M1000
240411R7

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